发明名称 Slurry composition for a chemical mechanical polishing process and method of manufacturing a semiconductor device using the slurry composition
摘要 A slurry composition for a chemical mechanical polishing process and a method of manufacturing a semiconductor memory device using the slurry composition are provided. The slurry composition may include about 0.001 percent by weight to about 5 percent by weight of a ceria abrasive, about 0.001 percent by weight to about 0.1 percent by weight of a nonionic surfactant adsorbed onto a polysilicon layer forming a passivation layer on the polysilicon layer, the nonionic surfactant having a chemical structure of a triblock copolymer including a first polyethylene oxide block, a polypropylene oxide block and a second polyethylene oxide block and a remainder of water.
申请公布号 US7799687(B2) 申请公布日期 2010.09.21
申请号 US20070907105 申请日期 2007.10.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SEONG CHOONG-KEE;CHUNG DAE-HYUK;HAN MYANG-SIK
分类号 H01L21/00 主分类号 H01L21/00
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