| 摘要 |
FIELD: physics. ^ SUBSTANCE: invention is designed for testing reliability of infrared multi-element photodetectors in which the matrix of photosensitive elements is placed inside a sealed housing, docked with a multiplexer or raster using conducting indium micro-columns, and its operating temperature is lower than ambient temperature. In order to test reliability of infrared multi-element photodetectors, accumulative operating time of the device is given for given ambient temperature values and maximum time of continuous operation of the device. Non-failure operating time is achieved through cycles involving attaining working temperature of the device, switching on the device by not less than one second, switching off the device and raising its working temperature to a given ambient temperature value. The number of cycles is determined from the ratio of the accumulative operating time to the given maximum time for continuous operation of the device. After the non-failure operating time, the control photoelectric parametre is measured at operating temperature of the device. The criterion of failure is fall of the value of the parametre blow a given value. ^ EFFECT: shorter testing time. ^ 2 dwg |
