METHOD OF TESTING STORABILITY OF INFRARED MULTI-ELEMENT PHOTODETECTOR

摘要

FIELD: physics. ^ SUBSTANCE: device has adhesive joints in an evacuated chamber with operating temperature of photosensitive elements lower than ambient temperature and is designed for detecting infrared radiation. In order to carry out tests, the number of storage cycles is given, including holding the switched off device for a given period of time. Duration of one cycle (tcycle) is given as a sum of the first (t1) and second (t2) time intervals. During the time interval t1, the device is held at a first temperature (T1) value. In time interval t2, the device is held under thermal cycling conditions between second (T2) and third (T3) temperature values. T1 and T2 exceed the given ambient temperature (T0) and but do not exceed high operating temperature of the medium (Thigh op). T3 is not lower than the lower operating temperature of the low temperature of the medium (Thigh op). The evacuated chamber undergoes gettering. Heat leakage of the switched on device or its time for entering the mode and at least one photoelectric parametre are measured under normal climatic conditions. ^ EFFECT: cutting on time for testing a multi-element photodetector. ^ 5 dwg