| 摘要 |
<P>PROBLEM TO BE SOLVED: To improve the accuracy of measuring results of the specific heat capacity and hemispherical total emissivity of a conductive sample of a high temperature by solving problems such as electromagnetic interference noise or the ununiformity of the sample temperature distribution. Ž<P>SOLUTION: A measuring method includes a step of energizing and rapidly heating the conductive sample and making the sample reach a target temperature Tm, a step of varying the current immediately after reaching the target temperature, and calculating a plurality of values of X and Y corresponding to different currents using the relational expression (formulas 6) of X and Y based on the temperature change rate dT/dt immediately after it, current I flowing in the sample, and the measuring data of voltage drop V of the sample, and a step of calculating the specific heat capacity c<SB>p</SB>and hemispherical total emissivity ε<SB>t</SB>using formula 7. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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