METHOD AND APPARATUS FOR SYSTEM TESTING USING SCAN CHAIN DECOMPOSITION

摘要

A method is provided for testing a portion of a system under test via a scan chain of the system under test. The method includes decomposing the scan chain into a plurality of segments, generating a set of instructions for testing the portion of the system under test, and executing the set of instructions for testing the portion of the system under test. The scan chain is composed of a plurality of elements, and each segment includes at least one of the elements of the scan chain. The set of instructions includes a plurality of processor instructions associated with an Instruction Set Architecture (ISA), and a plurality of test instructions. The test instructions include, for each of the plurality of segments of the scan chain, at least one scan operation to be performed on the segment. An associated apparatus also is provided.