| 摘要 |
PURPOSE: An apparatus and a method for evaluating a current sensing characteristic for a semiconductor memory device are provided to estimate the deviation and distribution of sensing property of a sense amp by supplying a test voltage for estimating the property of the sense amp. CONSTITUTION: A test current supply unit(140) supply a test current to an input-output line in a test mode. A sensing amplifier circuit(120) inputs the test current of the input-output line. The sensing amplifier circuit compares and amplifies a sensing input voltage and a reference voltage. The sensing amplifier circuit outputs a comparison and amplification result to a sensing output voltage.
|
