SEMICONDUCTOR DEVICE AND METHOD FOR CHECKING ABNORMALITY OF SEMICONDUCTOR DEVICE, AND BASE STATION

摘要

PROBLEM TO BE SOLVED: To provide an efficient semiconductor easy to specify a defect. SOLUTION: The semiconductor device 1 includes: a main circuit section 2; a power supply monitoring section 3 for monitoring whether or not a voltage of a power supply applied to the main circuit section 2 is a preset voltage, and giving a notice of a monitored result as visualized information; a sequence monitoring section 4 for monitoring whether or not a power supply sequence applied to the main circuit section 2 is a preset sequence, and giving a notice of a monitored result as visualized information; and a clock monitoring section 5 for monitoring whether or not a clock signal applied to the main circuit section 2 is a preset clock signal, and giving a notice of a monitored result as visualized information. COPYRIGHT: (C)2010,JPO&INPIT