发明名称 Quality Information Control Analysis System
摘要 A quality information collection analysis system includes at least one assembly installation having at least one assembly machine which assembles a component, and outputs an assembly time of an assembly as a production time, at least one inspection machine which inspects the assembly to which the component is assembled by the assembly machine, and outputs an inspection result of the assembly as inspection information, and a quality collection analysis device which manages quality information of the assembly, having a storing section which stores information of the component, the production time and the inspection information and a quality information collection analysis section which analyzes a defect factor of the assembly by using the information of the component, the production time and the inspection result.
申请公布号 US2010228510(A1) 申请公布日期 2010.09.09
申请号 US20100718702 申请日期 2010.03.05
申请人 RICOH COMPANY, LTD. 发明人 OKUBO HIDETOSHI
分类号 G06F19/00;G05B19/418;G06Q50/00;G06Q50/04 主分类号 G06F19/00
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