发明名称 TESTING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a testing device supplying a test signal that is made to maintain an optional phase state by performing phase synchronization of a pseudo response signal and a transmission leakage signal with a reference signal of an R/W (Reader/Writer) when testing the R/W of an RFID (Radio Frequency Identification). <P>SOLUTION: The testing device for testing the R/W of the RFID includes a phase synchronizing part 100 for outputting a phase synchronization signal obtained by performing phase synchronization with the reference signal of the reader/writer to be tested, a signal generating part 200 for generating a signal by performing phase synchronization of the pseudo response signal obtained by generating a tag response in a pseudo manner and a non-modulation continuous wave signal with the phase synchronization signal and maintaining them in an optional phase difference, and a connection part 300 for outputting a test signal obtained by connecting the pseudo response signal and the non-modulation continuous wave signal. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010198421(A) 申请公布日期 2010.09.09
申请号 JP20090043596 申请日期 2009.02.26
申请人 RENESAS ELECTRONICS CORP;NEC CORP 发明人 KURIMOTO YUJI
分类号 G06K17/00;H04B1/59;H04B5/02;H04B17/00 主分类号 G06K17/00
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