发明名称 |
MANUFACTURING METHOD OF PHASE CHANGE RANDOM ACCESS MEMORY DEVICE |
摘要 |
<p>PURPOSE: A phase change memory device manufacturing method is provided to form a phase change material layer of the same crystal state by maintaining the surface temperature of a wafer as the crystallization temperature of the phase change material. CONSTITUTION: A wafer(120) is offered. The wafer is heat at the predetermined temperature and offered in a deposition chamber(100). A phase change material layer(150) is formed on the heated wafer. The Wafer is heated to the crystallization temperature of the phase change material. The crystallization temperature of the phase change material is within 250°C~350°C range.</p> |
申请公布号 |
KR20100097299(A) |
申请公布日期 |
2010.09.03 |
申请号 |
KR20090016175 |
申请日期 |
2009.02.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, HAK WOON;RYU, IN CHEOL |
分类号 |
H01L21/8247;H01L21/20;H01L21/324;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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