发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing semiconductor wafer capable of improving yield by designing a clamping structure of a semiconductor wafer. SOLUTION: In an epitaxial processing process, an annular first wafer holder 2 and a ring plate 3 are used. The first wafer holder 2 is attached coaxially with a susceptor 11 and has a first circular opening 2a provided with a first edge part 21 which is brought into pressing contact with the wafer 1 over the whole periphery of peripheral edge of the main surface 1a of the wafer 1. The ring plate 3 has a second circular opening 3a provided with a second edge part 31 which is brought into pressing contact with the wafer 1 over the whole periphery of the peripheral edge of the back surface 1b of the wafer 1. Therein, the ring plate 3 clamps the wafer 1 in engagement with the first wafer holder 2. In a shrinkage process, the peripheral edge of the wafer 1 is removed such that the wafer 1 becomes a predetermined diameter. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010189745(A) 申请公布日期 2010.09.02
申请号 JP20090037671 申请日期 2009.02.20
申请人 SUMCO CORP 发明人 INOUE KAZUTOSHI
分类号 C23C16/458;H01L21/683 主分类号 C23C16/458
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