| 摘要 |
PROBLEM TO BE SOLVED: To detect a fault in manufacture by measuring an electric characteristic of an internal terminal. SOLUTION: This semiconductor device includes inside a first device 11 having an output buffer circuit 18, and a second device 12 having an input buffer circuit 20 inside, wherein an internal output terminal 15 of the first device 11 and an internal input terminal 16 of the second device are connected together through a wire 14. The second device 12 includes resistances 21a, 21b connected respectively to the internal input terminal 16, and switches 22a, 22b connected respectively to the resistances 21a, 21b. An output current of the output buffer circuit 18 or an input leak current of the input buffer circuit 20 is detected by controlling the switches 22a, 22b and by controlling a voltage of the internal output terminal 15 of the first device 11. COPYRIGHT: (C)2010,JPO&INPIT
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