发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: A nonvolatile semiconductor memory device and a manufacturing method thereof are provided to form a nonvolatile memory device and a transistor on the same substrate by easily forming the thickness of a second gate insulation layer of the nonvolatile memory device which is different from the thickness of the gate insulation layer of the transistor. CONSTITUTION: A first island shaped semiconductor region(210) has a first source region and a first drain region and is formed on a substrate. A first gate insulation layer includes a first channel formation region(211) and a first insulation layer. A floating gate electrode(216) is formed on the first gate insulation layer and is overlapped with an opening unit. A second gate insulation layer includes a third insulation layer formed on the floating gate electrode. A memory cell array includes a nonvolatile memory device including a control gate electrode on the second gate insulation layer. A second island shaped semiconductor region(230) includes a source region and a second drain region and is formed on the substrate. |
申请公布号 |
KR20100095397(A) |
申请公布日期 |
2010.08.30 |
申请号 |
KR20100015161 |
申请日期 |
2010.02.19 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
ASAMI YOSHINOBU;SATO MANABU |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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