发明名称 |
METHOD OF MANUFACTURING MULTI-GRAY SCALE PHOTOMASK AND METHOD OF MANUFACTURING SEMICONDUCTOR TRANSISTOR |
摘要 |
<p>PURPOSE: A method for manufacturing a multi gray scale photo mask and a method for manufacturing a semiconductor transistor are provided to suppress a dark defect by preventing the de-lamination of a resist pattern. CONSTITUTION: A semi-transmitting layer(102) and a shielding layer(103) are successively formed on a transmitting substrate(101). A mask blank with a first resist layer is formed on the uppermost layer. A pattern is drawn and developed on the first resist layer. A transmitting unit(111) is formed with the first resist pattern and the shielding layer pattern. A second resist layer is formed to cover the substrate by removing the first resist pattern. A pattern is drawn and developed on the second resist layer and a second resist pattern is formed. A semi-transmitting unit(112) and a shielding unit(113) are formed.</p> |
申请公布号 |
KR20100095392(A) |
申请公布日期 |
2010.08.30 |
申请号 |
KR20100015018 |
申请日期 |
2010.02.19 |
申请人 |
HOYA CORPORATION |
发明人 |
FUKUMOTO TOMONORI;MIYOSHI MASAYUKI |
分类号 |
H01L21/027;G03F1/54;G03F1/58;G03F7/20;H01L21/336;H01L29/786 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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