发明名称 SEMICONDUCTOR EMBEDDED RESISTOR GENERATION
摘要 <p>A method for generating an embedded resistor in a semiconductor device are provided, the method including forming a shallow trench isolation (STI) region in a substrate; forming a pad oxide on the STI region and substrate; depositing a silicon layer on the pad oxide; forming a photo- resist mask on a portion of the silicon layer; etching the silicon layer to yield a poly-conductor (PC); oxidizing the PC; depositing at least one of an oxide material or a metal gate material on the oxidized surface; depositing a silicon layer on the at least one oxide material or metal gate material; patterning a transistor gate structure disposed substantially away from the STI region. Fig. 15</p>
申请公布号 SG163492(A1) 申请公布日期 2010.08.30
申请号 SG20100002541 申请日期 2010.01.14
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD;SAMSUNG ELECTRONICS CO. LTD;INTERNATIONAL BUSINESS MACHINES CORPORATION;INFINEON TECHNOLOGIES NORTH AMERICA CORP.;FREESCALE SEMICONDUCTOR INC. 发明人 CHOONGRYUL RYOU;SEUNGHWAN LEE;JUN YUAN;CHAN VICTOR;ELLER MANFRED;SUNG KIM NAM;KANIKE NARASIMHULU;SAMAVEDAM SRIKANTH BALAJI
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