| 摘要 |
A method for presenting various surfaces of particles within a sample to a sensor device is provided. More particularly, embodiments of the present invention provide a method for presenting a sample comprising a plurality of sample particles to a scanning field defined by a sensor device, the method including directing the sample into a scanning chamber configured to contain at least a portion of the scanning field of the sensor device, subjecting the sample to different relative velocities, and redirecting the sample into the scanning chamber such that the plurality of sample particles of the sample are reoriented relative to the scanning field defined by the sensor device. In some embodiments, at least one trait of the sample is measured with the sensor device. |
