发明名称 Conveyor-Based Memory-Module Tester with Elevators Distributing Moving Test Motherboards Among Parallel Conveyors For Testing
摘要 A conveyor-stack test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move along conveyors. A loader-unloader removes tested memory modules from test sockets on the motherboards and inserts untested memory modules into the motherboards using a robotic arm. A conveyor carries the motherboards from the loader-unloader to an elevator. The elevator raises or lowers the motherboards to different levels in a conveyor stack with multiple levels of conveyors each with many test stations. The motherboards move along conveyors in the conveyor stack until reaching test stations. A retractable connector from the test station extends to make contact with a motherboard connector to power up the motherboard, which then tests the memory modules. Test results are communicated from the test station to a host controller, which instructs the loader-unloader to sort the tested memory modules once the motherboard returns.
申请公布号 US2010213027(A1) 申请公布日期 2010.08.26
申请号 US20090392387 申请日期 2009.02.25
申请人 KINGSTON TECHNOLOGY CORP. 发明人 CO RAMON S.;SUN KEVIN J.
分类号 B65G37/00;G06F11/07 主分类号 B65G37/00
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