Micrometer-based measuring system and method of using same

摘要

A measuring system (100) for flatness degree measurement includes a measuring instrument (10) and a processing device (20). The measuring instrument has a base (12), a guide column (14), a sliding member (16), a digital micrometer (18) and a holding member (19). The guide column is vertically attached to the base. The sliding member is moveably attached to the guide column. The digital micrometer is firmly fastened to the sliding member. The holding member is configured for fixing a workpiece (40) and has a reference-standard surface formed thereon. The processing device electronically connects with the digital micrometer. The processing device receives a plurality of measured values from the digital micrometer and displays a testing result after processing the measured values.