发明名称 Schottky diode structures having deep wells for improving breakdown voltages
摘要 An integrated circuit structure includes a semiconductor substrate; a well region of a first conductivity type over the semiconductor substrate; a metal-containing layer on the well region, wherein the metal-containing layer and the well region form a Schottky barrier; an isolation region encircling the metal-containing layer; and a deep-well region of a second conductivity type opposite the first conductivity type under the metal-containing layer. The deep-well region has at least a portion vertically overlapping a portion of the metal-containing layer. The deep-well region is vertically spaced apart from the isolation region and the metal-containing layer by the well region.
申请公布号 US7781859(B2) 申请公布日期 2010.08.24
申请号 US20080054224 申请日期 2008.03.24
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHIANG PUO-YU;LIN TSAI CHUN;YAO CHIH-WEN (ALBERT);HO DAVID
分类号 H01L29/47 主分类号 H01L29/47
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