| 摘要 |
PURPOSE: A TAP IC direct contact type probe unit is provided to improve workability by making it possible that blocks are compatible with each other. CONSTITUTION: A fine align control TAP(110) is formed in the right and left side of a block body(100) and controls alignment. A fine align adjustment is executed by moving an angle plate(200) to the left and right. The angle plate is arranged in the same location with the fine align adjustment in a different block, and the compatibility between blocks is possible.
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