发明名称 PROBE PIN AND PROBE UNIT
摘要 <P>PROBLEM TO BE SOLVED: To provide an IC socket for receiving a probe pin for applying different pressures to a solder and a pad, and flowing a relatively-high current. Ž<P>SOLUTION: The probe pin 130 includes plungers 131, 135 disposed on both ends and springs 132, 134 having different strengths connected to the plungers 131, 135. The springs 132, 134 have different lengths from an axial center to a spiral section. The IC socket includes a stepped hole 120 for partially receiving the probe pin and a conductive part 123 positioned so as to contact and bridge at least two points of the probe pin 130 on the inner wall of the hole 120. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010181236(A) 申请公布日期 2010.08.19
申请号 JP20090024015 申请日期 2009.02.04
申请人 KASASAKU ELECTRONICS:KK 发明人 RYUSAKU MISUO;MIYAHIRA TAKAFUMI;OTSUJI FUMIAKI
分类号 G01R1/067 主分类号 G01R1/067
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