发明名称 |
MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To facilitate removal of a film to diffuse metal atoms inside a gate insulating film. Ž<P>SOLUTION: A manufacturing method for a semiconductor device includes: a step of forming a base film on a semiconductor substrate; a step of forming a gate insulating film on the base film; a step of forming a metal film on the gate insulating film; a step of subjecting the semiconductor substrate, the base film, the gate insulating film, and the metal film to heat treatment in an atmosphere of at least either one of nitrogen gas and inert gas; a step of removing the metal film remaining on the gate insulating film; and a step of forming a gate electrode film on the gate insulating film. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2010177265(A) |
申请公布日期 |
2010.08.12 |
申请号 |
JP20090015573 |
申请日期 |
2009.01.27 |
申请人 |
FUJITSU SEMICONDUCTOR LTD |
发明人 |
NAMIKATA HIROSHI;IKEDA KAZUTO;TAKAHASHI HARUHIKO |
分类号 |
H01L29/78;H01L21/283;H01L21/316;H01L21/8238;H01L27/092;H01L29/423;H01L29/49 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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