发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to increase the lower power property and operating speed of a semiconductor using a germanium layer which is formed on an upper insulating layer after forming a lower insulating layer. CONSTITUTION: A bonding layer(110) and an insulating layer(120) are formed on a polymer substrate(100). A germanium layer(130) is formed on the insulating layer. An oxide film(140), a gate electrode(150), and a hard mask layer(160) are formed successively on the germanium layer. A photosensitive pattern is formed through an exposure and a development process using a gate pattern mask. The hard mask layer, a gate electrode, and an oxide film are etched to form a gate pattern by using the photosensitive pattern as a mask.
申请公布号 KR20100089602(A) 申请公布日期 2010.08.12
申请号 KR20090008930 申请日期 2009.02.04
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YEO, TAE YEON;JANG, CHI HWAN
分类号 H01L21/205;H01L27/12 主分类号 H01L21/205
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