发明名称 SEMICONDUCTOR MANUFACTURING SYSTEM
摘要 Disclosed is a technique for effectively suppressing the generation of particles resulting from peeling-off of unnecessary films that have unavoidably adhered to the inner surface of the reaction tube of an ALD film-forming apparatus. A precoating process utilizing ALD is performed to deposit a metal oxide film, e.g., an aluminum oxide film, onto the unnecessary films, in order to prevent peeling-off of the unnecessary films. The type and/or position of the nozzle for supplying ozone, as a precoat gas, into the reaction tube during the precoating process is different from that of the nozzle for supplying ozone, as a film-forming gas, into the reaction tube during forming of a film on a semiconductor substrate.
申请公布号 US2010203741(A1) 申请公布日期 2010.08.12
申请号 US20100766319 申请日期 2010.04.23
申请人 TOKYO ELECTRON LIMITED 发明人 MOROZUMI YUICHIRO;KOYANAGI KENICHI;ARAO TAKASHI;UNE KAZUNORI
分类号 H01L21/473;H01L21/469 主分类号 H01L21/473
代理机构 代理人
主权项
地址