发明名称 A NANOWIRE AFM PROBE FOR IMAGING SOFT MATERIALS
摘要 The invention provides for a device comprising a support and a nanowire attached to the support designed for use with an atomic force microscope (AFM).
申请公布号 WO2010091311(A2) 申请公布日期 2010.08.12
申请号 WO2010US23407 申请日期 2010.02.05
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA;ASHBY, PAUL, D.;SCHUCK, JAMES, P.;ALONI, SHAUL;SANII, BABAK 发明人 ASHBY, PAUL, D.;SCHUCK, JAMES, P.;ALONI, SHAUL;SANII, BABAK
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