发明名称 INFRARED RADIATION SENSITIVE STRUCTURE AND METHOD OF MAKING SAID STRUCTURE
摘要 FIELD: physics. ^ SUBSTANCE: infrared radiation sensitive structure having a substrate whose top layer is made from CdTe, a 10 mcm thick working detector layer made from Hg1-xCdxTe, where x=xd=0.2-0.3, a 0.1-0.2 mcm thick insulating layer made from CdTe, and a top conducting layer with thickness of approximately 0.5 mcm also has a 0.5-6.0 mcm thick lower variband layer between the substrate and the detector layer, where the said variband layer is made from Hg1-xCdxTe, where the value of x gradually falls from a value in the range of 1-(xd+0.1) to a value xd, between the working detector layer and the insulating layer, a top variband layer with thickness of 0.03-1.00 mcm made from Hg1-xCdxTe where the value of x gradually increases from a value xd to a value in the range of 1-(xd+0.1), and dielectric layers between the insulating layer and the top conducting layer. Disclosed also is a method of making the said structure. ^ EFFECT: possibility of making a highly stable infrared sensitive structure with broad functional capabilities. ^ 12 cl, 1 dwg
申请公布号 RU2396635(C1) 申请公布日期 2010.08.10
申请号 RU20090130692 申请日期 2009.08.11
申请人 GOSUDARSTVENNOE OBRAZOVATEL'NOE UCHREZHDENIE VYSSHEGO PROFESSIONAL'NOGO OBRAZOVANIJA "TOMSKIJ GOSUDARSTVENNYJ UNIVERSITET" (TGU);UCHREZHDENIE ROSSIJSKOJ AKADEMII NAUK INSTITUT FIZIKI POLUPROVODNIKOV IM. A.V. RZHANOVA SIBIRSKOGO OTDELENIJA RAN (IFP SO RAN) 发明人 VOJTSEKHOVSKIJ ALEKSANDR VASIL'EVICH;NESMELOV SERGEJ NIKOLAEVICH;DZJADUKH STANISLAV MIKHAJLOVICH;SIDOROV JURIJ GEORGIEVICH;DVORETSKIJ SERGEJ ALEKSEEVICH;MIKHAJLOV NIKOLAJ NIKOLAEVICH;VARAVIN VASILIJ SEMENOVICH;JAKUSHEV MAKSIM VITAL'EVICH;VASIL'EV VLADIMIR VASIL'EVICH
分类号 H01L31/101 主分类号 H01L31/101
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