发明名称 Formation of a MOSFET using an angled implant
摘要 A LDMOS transistor having a channel region located between an outer boundary of an n-type region and an inner boundary of a p-body region. A width of the LDMOS channel region is less than 80% of a distance between an outer boundary of an n+-type region and the inner boundary of a p-body region. Also, a method for making a LDMOS transistor where the n-type dopants are implanted at an angle that is greater than an angle used to implant the p-type dopants. Furthermore, a VDMOS having first and second channel regions located between an inner boundary of a first and second p-body region and an outer boundary of an n-type region of the first and second p-body regions. The width of the first and second channel regions of the VDMOS is less than 80% of a distance between the inner boundary of the first and second p-body regions and an outer boundary of an n+-type region of the first and second p-body regions. Moreover, a method for making a VDMOS transistor where the n-type dopants are implanted at an angle that is greater than an angle used to implant the p-type dopants.
申请公布号 US7772075(B2) 申请公布日期 2010.08.10
申请号 US20090509935 申请日期 2009.07.27
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 PENDHARKAR SAMEER;HU BINGHUA
分类号 H01L21/336 主分类号 H01L21/336
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