发明名称 Phase Change Memory With Dual Word Lines and Source Lines and Method of Operating Same
摘要 A phase change memory device includes a memory cell, first word line conductor and a second word line conductor, and first and second access devices responsive to the first and second word line conductors respectively. Control circuits are arranged to access the memory cell for read operations using only the first word line conductor to establish a current path from the bit line through the memory cell to a source line through the first access device, and to access the memory cell for operations to reset the memory cell using both the first and second access devices to establish a current path from the bit line through the memory cell to two source lines.
申请公布号 US2010195378(A1) 申请公布日期 2010.08.05
申请号 US20100759479 申请日期 2010.04.13
申请人 MACRONIX INTERNATIONAL CO., LTD.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LUNG HSIANG LAN;LAM CHUNG
分类号 G11C11/00 主分类号 G11C11/00
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