发明名称 |
ELECTRON BEAM EXPOSURE SYSTEM |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an electron beam exposure system. <P>SOLUTION: The electron beam exposure system transfers a pattern onto the surface of a target (14). The electron beam exposure system includes: a beamlet generator generating a plurality of electron beamlets (5a, 5b); a modulation array that includes a plurality of modulators modulating intensity of the electron beamlets and receives the plurality of electron beamlets; a controller connected to the modulation array for controlling the respective modulators independently; a regulator operatively connected to the respective modulators so that control signals of the respective modulators are adjusted individually; a convergent electron optical system including an array of electrostatic lenses (7), where each focuses a corresponding and individual beamlet transmitted by the modulation array on a section smaller than 300 nm; and a target holder for holding the target on an exposed surface of the pattern where the pattern is transferred in a first convergent surface of the convergent electron optical system. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
申请公布号 |
JP2010171452(A) |
申请公布日期 |
2010.08.05 |
申请号 |
JP20100088024 |
申请日期 |
2010.04.06 |
申请人 |
MAPPER LITHOGRAPHY IP BV |
发明人 |
WIELAND JAN-JACO MARCO;KAMPHERBEEK BERT JAN;KRUIT PIETER;ALEXANDER HENDRIK VINCENT VAN VEEN |
分类号 |
H01L21/027;A61N5/00;G01Q30/02;G01Q30/08;G03B1/00;H01J37/08;H01J37/30;H01J37/304;H01J37/317 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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