发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which has an electrode of a low resistance and can reduce the number of patterning processes, and to provide a method of manufacturing the same. SOLUTION: The method for manufacturing the semiconductor device includes a step which forms a first metal layer on a semiconductor substrate with a diffusion layer formed thereon, a step which forms an insulating having an opening portion on the first metal layer, a step which forms a second metal layer on the first metal layer in the opening portion of the insulating layer, a step which removes the insulating layer, a step which covers on the exposed surface of the second metal layer with a third metal layer containing a metal of ionization tendency smaller than the second metal layer, and a step which forms an electrode wiring having the first, second, and third metal layers by removing the first metal layer with the third metal layer as a mask. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010171365(A) 申请公布日期 2010.08.05
申请号 JP20090107728 申请日期 2009.04.27
申请人 TOSHIBA CORP 发明人 IMAMURA TOMOMI;MATSUDA TETSURO;SAIJO YOSHINOSUKE
分类号 H01L21/28;H01L21/3205;H01L21/336;H01L23/52;H01L29/78 主分类号 H01L21/28
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