发明名称 Selectively activated multi-subcarrier (SAMS) radio transceiver measuring techniques
摘要 Testing of a wireless transceiver employs a selectively activated multi-subcarrier test vector or corresponding waveform for which all subcarriers are activated except subcarriers below a selected subcarrier fundamental and harmonics of the selected subcarrier fundamental. Use of selectively activated multi-subcarrier testing allows measurement of inter-modulation distortion, harmonic distortion, frequency response, and phase noise using a common spectrum analyzer, with individual results pinpointing sources of impairment.
申请公布号 US7769372(B1) 申请公布日期 2010.08.03
申请号 US20040887243 申请日期 2004.07.08
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 WONG HEE
分类号 H04W24/00 主分类号 H04W24/00
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