发明名称 Method and structure for forming a shielded gate field effect transistor
摘要 A method of forming a charge balance MOSFET includes the following steps. A substrate with an overlying epitaxial layer both of a first conductivity type, are provided. A gate trench extending through the epitaxial layer and terminating within the substrate is formed. A shield dielectric lining sidewalls and bottom surface of the gate trench is formed. A shield electrode is formed in the gate trench. A gate dielectric layer is formed along upper sidewalls of the gate trench. A gate electrode is formed in the gate trench such that the gate electrode extends over but is insulated from the shield electrode. A deep dimple extending through the epitaxial layer and terminating within the substrate is formed such that the deep dimple is laterally spaced from the gate trench. The deep dimple is filled with silicon material of the second conductivity type.
申请公布号 US7767524(B2) 申请公布日期 2010.08.03
申请号 US20090582487 申请日期 2009.10.20
申请人 FAIRCHILD SEMICONDUCTOR CORPORATIION 发明人 YILMAZ HAMZA;CALAFUT DANIEL;SAPP STEVEN;KRAFT NATHAN;CHALLA ASHOK
分类号 H01L21/336;H01L23/62 主分类号 H01L21/336
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