发明名称 INSTALLATION BADNESS CAUSE ANALYTICAL METHOD
摘要 PURPOSE: A method for analyzing the cause of a mount failure of a substrate with the naked eyes is provide to rapidly grasp a defect by comparing the previously registered images with a cross line to show the recognition result. CONSTITUTION: A vision recognition image used in a mounting process of parts mounter and recognition results are registered in an encoding image database(S100). The part mounting area of the substrate is photographed and the mounting correctness is inspected(S200). A mount position of the substrate or the name of a defective part is searched from an image database(S300). The image of the searched part and the recognition result are displayed with a cross line together(S400). The normal state of the vision recognition is determined by comparing the central coordinate and angle of the cross line with the image of the part shown on a display window(S500).
申请公布号 KR20100085680(A) 申请公布日期 2010.07.29
申请号 KR20090005095 申请日期 2009.01.21
申请人 SAMSUNG TECHWIN CO., LTD. 发明人 LEE, MAN HEE
分类号 H05K13/04;G01B11/24;H05K3/30 主分类号 H05K13/04
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