发明名称 |
RESISTANCE MEMORY DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a resistance memory device capable of achieving a highly dense memory array by a simple manufacturing method, and to provide a method of manufacturing the same. SOLUTION: The method of manufacturing the resistance-memory device 1 includes a step of forming a bit-line stack with a plurality of local bit lines vertically stacked on a substrate; forming word lines including a plurality of local word lines vertically extended at the side of the bit-line stack and a connection line horizontally extended to connect the plurality of local word lines; and forming a resistance memory thin film between the bit-line stack and the word lines. Accordingly, the highly dense memory array can be achieved with a three-dimensional cross-point architecture selected as the simple manufacturing method. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010166047(A) |
申请公布日期 |
2010.07.29 |
申请号 |
JP20100001971 |
申请日期 |
2010.01.07 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
YOON HONG SIK;BAEK IN-GYU;SIM HYUN-JUN;ZHAO JIN-SHI;PARK MIN-YOUNG |
分类号 |
H01L27/10;H01L45/00;H01L49/00 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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