发明名称 Reflectors, substrate processing apparatuses and methods for the same
摘要 A substrate processing apparatus may include a processing chamber including a plasma generating unit arranged in an upper region thereof. A grid system, which may extract ions from plasma formed by the plasma generating unit and may accelerate the ions to have substantially uniform directivity. The grid system may be positioned below the plasma generating unit. A reflector may be arranged below the grid system and may include parallel reflecting plates for converting the ions accelerated from the grid system into neutral beams.
申请公布号 US2010190356(A1) 申请公布日期 2010.07.29
申请号 US20100659331 申请日期 2010.03.04
申请人 HWANG SUNG-WOOK;SHIN CHUL-HO 发明人 HWANG SUNG-WOOK;SHIN CHUL-HO
分类号 H01L21/26 主分类号 H01L21/26
代理机构 代理人
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