发明名称 PHOTO MASK USED IN FABRICATION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A photomask is provided to be used for transferring mask patterns on a photoresist film even when a semiconductor substrate has step difference under a dipole illumination system of projection exposure equipment and to stabilize a lithography process. CONSTITUTION: A photomask(2) is transferred on a semiconductor substrate having upper and lower step differences of the substrate. The upper and lower parts are located in different heights using a dipole illumination system. The photomask includes first and second patterns(10,20) having first and second concave-convex parts. The first and second mask patterns correspond to the lower difference of the semiconductor substrate.
申请公布号 KR20100083989(A) 申请公布日期 2010.07.23
申请号 KR20090003361 申请日期 2009.01.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, BONG CHEOL;LEE, DAE YOUP;LEE, JAE HAN;KIM, EUN SUNG;SON, BYEONG HWAN
分类号 G03F1/00;H01L21/027 主分类号 G03F1/00
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