发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>Disclosed is a method for manufacturing a semiconductor device, which comprises: a step (a) wherein an interlayer insulating film is formed on a substrate; a step (b) wherein the interlayer insulating film is provided with a wiring line; a step (c) wherein the upper surface of the wiring line and the upper surface of the interlayer insulating film are coated with an organic solution; a step (d) wherein the upper surface of the wiring line and the upper surface of the interlayer insulating film are coated with a silylating solution after the step (c); a step (e) wherein the substrate is heated after the step (d); and a step (f) wherein a first liner insulating film is formed at least on the upper surface of the wiring line.</p>
申请公布号 WO2010082251(A1) 申请公布日期 2010.07.22
申请号 WO2009JP05678 申请日期 2009.10.28
申请人 MORINAGA, YASUNORI;PANASONIC CORPORATION 发明人 MORINAGA, YASUNORI
分类号 H01L23/52;H01L21/768;H01L21/314;H01L21/318;H01L21/3205 主分类号 H01L23/52
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