发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<p>Disclosed is a method for manufacturing a semiconductor device, which comprises: a step (a) wherein an interlayer insulating film is formed on a substrate; a step (b) wherein the interlayer insulating film is provided with a wiring line; a step (c) wherein the upper surface of the wiring line and the upper surface of the interlayer insulating film are coated with an organic solution; a step (d) wherein the upper surface of the wiring line and the upper surface of the interlayer insulating film are coated with a silylating solution after the step (c); a step (e) wherein the substrate is heated after the step (d); and a step (f) wherein a first liner insulating film is formed at least on the upper surface of the wiring line.</p> |
申请公布号 |
WO2010082251(A1) |
申请公布日期 |
2010.07.22 |
申请号 |
WO2009JP05678 |
申请日期 |
2009.10.28 |
申请人 |
MORINAGA, YASUNORI;PANASONIC CORPORATION |
发明人 |
MORINAGA, YASUNORI |
分类号 |
H01L23/52;H01L21/768;H01L21/314;H01L21/318;H01L21/3205 |
主分类号 |
H01L23/52 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|