| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a drop tester for a semiconductor chip package product and usage thereof. Ž<P>SOLUTION: The drop tester 100 includes a drop starting angle setting tool 120 placed on a fixed rack 110 horizontally movably to set a DUT (device under test) 10 at a prescribed angle, and secured to a clamp 130 accurately, rapidly, and safely. A tool like this provides a second reference plane 123 to couple it to an elevatable/adjustable test sample table 121. The sample table 121 comprising a first reference plane 122 allows the DUT 10 to be attached to or detached from the tool 120 such that neither friction arises nor the DUT 10 is moved after it is held by the clamp 130. Accordingly, the DUT 10 can be not only accurately positioned but the tool 120 can be returned rapidly and safely to a reference position by using the design of a slide rail and a stopper. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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