发明名称 CIRCUIT DEVICE, METHOD FOR MANUFACTURING CIRCUIT DEVICE AND EVALUATION METHOD OF CIRCUIT DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a structure of a semiconductor device in which a gold ball such as an Au bump is bonded to an Au electrode by solid phase diffusion, and the quality of the bonded part is easily determined. <P>SOLUTION: An Au fine crystal film having smaller crystal grains than Au electrode crystal grains is formed on the Au electrode. The Au bump is pressure bonded to the Au electrode on which the Au fine crystal film is formed. Thereby, it becomes easy to confirm re-crystallized grains formed over the bonded surface between the Au fine crystal film and the Au bump by enlarging the cross section of a first electrode and the Au bump for observation and the quality is determined. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010161296(A) 申请公布日期 2010.07.22
申请号 JP20090003759 申请日期 2009.01.09
申请人 STANLEY ELECTRIC CO LTD 发明人 NOZAKI TAKAHIKO
分类号 H01L21/60 主分类号 H01L21/60
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