发明名称 |
SYSTEM AND METHOD FOR ASSESSING VIRTUAL SLIDE IMAGE QUALITY |
摘要 |
<p>Systems and methods for assessing virtual microscope slide image quality are provided. In order to determine whether a virtual slide image has any out of focus areas and is therefore a candidate for manual inspection, the various focus points used to scan the virtual slide image are used to calculate a best fit surface for the virtual slide image. The distance of each focus point from the best fit surface is then calculated and the largest distance is compared to a predetermined value. If the largest distance from a focus point to the best fit surface is larger than the predetermined value, then the virtual slide image is designated as needing a manual inspection and possible re-scan.</p> |
申请公布号 |
EP1751599(A4) |
申请公布日期 |
2010.07.21 |
申请号 |
EP20050760517 |
申请日期 |
2005.05.26 |
申请人 |
APERIO TECHNOLOGIES, INC. |
发明人 |
OLSON, ALLEN;SALIGRAMAL, KIRAN;SOENKSEN, DIRK, G. |
分类号 |
G06T7/00;A61B8/02;G01N27/72;G02B7/04;G02B21/36;G06K9/00 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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