发明名称 SYSTEM AND METHOD FOR ASSESSING VIRTUAL SLIDE IMAGE QUALITY
摘要 <p>Systems and methods for assessing virtual microscope slide image quality are provided. In order to determine whether a virtual slide image has any out of focus areas and is therefore a candidate for manual inspection, the various focus points used to scan the virtual slide image are used to calculate a best fit surface for the virtual slide image. The distance of each focus point from the best fit surface is then calculated and the largest distance is compared to a predetermined value. If the largest distance from a focus point to the best fit surface is larger than the predetermined value, then the virtual slide image is designated as needing a manual inspection and possible re-scan.</p>
申请公布号 EP1751599(A4) 申请公布日期 2010.07.21
申请号 EP20050760517 申请日期 2005.05.26
申请人 APERIO TECHNOLOGIES, INC. 发明人 OLSON, ALLEN;SALIGRAMAL, KIRAN;SOENKSEN, DIRK, G.
分类号 G06T7/00;A61B8/02;G01N27/72;G02B7/04;G02B21/36;G06K9/00 主分类号 G06T7/00
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