发明名称 A METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of manufacturing a semiconductor device is provided to minimize the large size of a memory cell size by forming an SRAM memory cell with fourth MISFET and two bell type MSFET. CONSTITUTION: A first film is formed on a conductive film which is formed in the main surface of a semiconductor substrate(1). The first film is patterned to form first patterns. Second patterns are formed in a second direction. A conductive film is patterned to form the gate pattern for the gate electrode(7A,7B) of MISFETs. A memory cell comprises a first drive MISFET(DR1), a second driver MISFET(DR2), a first electrical transmission MISFET(TR1), and a second electrical transmission MISFET. The first drive MISFET and the first electrical transmission MISFET are cross-combined with the second driver MISFET and the second electrical transmission MISFET.
申请公布号 KR20100080882(A) 申请公布日期 2010.07.13
申请号 KR20100051380 申请日期 2010.05.31
申请人 KABUSHIKI KAISHA HITACHI SEISAKUSHO(D/B/A HITACHI, LTD.);HITACHI ULSI SYSTEMS CO., LTD. 发明人 CHAKIHARA KIRAKU;OKUYAMA KOUSUKE;MONIWA MASAHIRO;MIZUNO MAKOTO;OKAMOTO KEIJI;NOGUCHI MITSUHIRO;YOSHIDA TADANORI;TAKAHASHI YASUHIKO;NISHIDA AKIO
分类号 H01L27/10;H01L21/336;H01L21/8238;H01L21/8244;H01L27/11;H01L29/786 主分类号 H01L27/10
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