发明名称 |
A METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of manufacturing a semiconductor device is provided to minimize the large size of a memory cell size by forming an SRAM memory cell with fourth MISFET and two bell type MSFET. CONSTITUTION: A first film is formed on a conductive film which is formed in the main surface of a semiconductor substrate(1). The first film is patterned to form first patterns. Second patterns are formed in a second direction. A conductive film is patterned to form the gate pattern for the gate electrode(7A,7B) of MISFETs. A memory cell comprises a first drive MISFET(DR1), a second driver MISFET(DR2), a first electrical transmission MISFET(TR1), and a second electrical transmission MISFET. The first drive MISFET and the first electrical transmission MISFET are cross-combined with the second driver MISFET and the second electrical transmission MISFET.
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申请公布号 |
KR20100080882(A) |
申请公布日期 |
2010.07.13 |
申请号 |
KR20100051380 |
申请日期 |
2010.05.31 |
申请人 |
KABUSHIKI KAISHA HITACHI SEISAKUSHO(D/B/A HITACHI, LTD.);HITACHI ULSI SYSTEMS CO., LTD. |
发明人 |
CHAKIHARA KIRAKU;OKUYAMA KOUSUKE;MONIWA MASAHIRO;MIZUNO MAKOTO;OKAMOTO KEIJI;NOGUCHI MITSUHIRO;YOSHIDA TADANORI;TAKAHASHI YASUHIKO;NISHIDA AKIO |
分类号 |
H01L27/10;H01L21/336;H01L21/8238;H01L21/8244;H01L27/11;H01L29/786 |
主分类号 |
H01L27/10 |
代理机构 |
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地址 |
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