发明名称 AUTOMATIC ANALYZER
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an automatic analyzer capable of rapidly dealing with additional inspection requests that occurs on an analyte during analysis or analyte abnormality caused in the analyte. <P>SOLUTION: Purpose-built ejecting and inserting positions are provided in the analyzer in addition to ejecting and inserting positions regularly used for analytes, and an additionally requested analyte or an analyte generating abnormality in the coarse of analysis is ejected. The ejected analyte undergoes some treatment and is inserted again, thereby the state in the coarse of the analysis can be continued. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010151569(A) 申请公布日期 2010.07.08
申请号 JP20080328998 申请日期 2008.12.25
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 AKUTSU MASASHI;MATSUBARA SHIGEKI;TAKAGI YOSHIMITSU;TOKIEDA HITOSHI
分类号 G01N35/02;G01N35/04 主分类号 G01N35/02
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