发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To improve, especially, flatness of a surface of an epitaxial layer formed on a semiconductor substrate in a method of manufacturing a BiCMOS as a semiconductor device in which microfabrication is needed. Ž<P>SOLUTION: The method of manufacturing the BiCMOS includes: a first step of forming a hollow part 32 by etching the principal surface of a P type silicon substrate 1; a second step of forming an N+ type buried layer 2 on the P type silicon substrate 1 using a silicon oxide film 22 covering the hollow part 32 as a mask; a third step of thermally oxidizing the principal surface of the P type silicon substrate 1 including the N+ buried layer 2 to form a silicon thermal oxide film 25 including the silicon oxide film 22 on the P type silicon substrate 1; and a fourth step of forming an N type epitaxial layer on the principal surface of the P type silicon substrate 1 including the N+ buried layer 2 after removing the silicon thermal oxide film 25. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2010153446(A) |
申请公布日期 |
2010.07.08 |
申请号 |
JP20080327459 |
申请日期 |
2008.12.24 |
申请人 |
SANYO ELECTRIC CO LTD;SANYO SEMICONDUCTOR CO LTD |
发明人 |
KOBAYASHI SHINJI;IMAI TSUTOMU;YAMANOUCHI KOICHI;SHOGA MAKOTO |
分类号 |
H01L21/8249;H01L21/331;H01L21/8222;H01L21/8248;H01L27/06;H01L29/732 |
主分类号 |
H01L21/8249 |
代理机构 |
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代理人 |
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地址 |
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