发明名称 METHOD OF MANUFACTURING METAL DOT AND METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing metal dots in which density of dots can be controlled depending on the kind of a gas when a metal thin film is processed with remote plasma. SOLUTION: An SiO<SB>2</SB>film 502 is formed on a semiconductor substrate 501 made of Si (step (b)), and the metal thin film 504 is formed on the SiO<SB>2</SB>film 502 (step (c)). Then, the metal thin film 504 is processed with remote plasma generated using a gas selected out of a hydrogen gas, a helium gas, an argon gas, a nitrogen gas, an ammonium gas, a mixed gas of a hydrogen gas and a helium gas, a mixed gas of a hydrogen gas and an argon gas, and a mixed gas of a hydrogen gas and a nitrogen gas (step (d)). Consequently, the metal dots 503 are formed on the SiO<SB>2</SB>film 502 (step (e)). COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010153612(A) 申请公布日期 2010.07.08
申请号 JP20080330536 申请日期 2008.12.25
申请人 HIROSHIMA UNIV 发明人 MAKIHARA KATSUNORI;MIYAZAKI SEIICHI;IKEDA MITSUHISA;SHIMANOE KAZUHIRO
分类号 H01L21/3065;H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/3065
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