发明名称 |
METHOD OF FORMING A GATE IN A FLASH MEMORY DEVICE |
摘要 |
<p>PURPOSE: A method for forming a gate in a flash memory device is provided to suppress the charge loss of conductive films for floating gates by forming a conductive film a first floating gate and additionally depositing the other conductive film for a second floating gate. CONSTITUTION: A tunnel insulating film and a conductive film for a first floating gate(102) are formed on a semiconductor substrate. A conductive film for a second floating gate(103) is formed on the conductive film for the first floating gate. The conductive film for the second floating gate has a nano-grain size. A dielectric film and a conductive film for a control gate(106) are formed on the conductive film for the second floating gate.</p> |
申请公布号 |
KR20100074656(A) |
申请公布日期 |
2010.07.02 |
申请号 |
KR20080133145 |
申请日期 |
2008.12.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, SANG SOO;SHIN, SEUNG WOO;KIM, JAE MUN |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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