发明名称 METHOD OF FORMING A GATE IN A FLASH MEMORY DEVICE
摘要 <p>PURPOSE: A method for forming a gate in a flash memory device is provided to suppress the charge loss of conductive films for floating gates by forming a conductive film a first floating gate and additionally depositing the other conductive film for a second floating gate. CONSTITUTION: A tunnel insulating film and a conductive film for a first floating gate(102) are formed on a semiconductor substrate. A conductive film for a second floating gate(103) is formed on the conductive film for the first floating gate. The conductive film for the second floating gate has a nano-grain size. A dielectric film and a conductive film for a control gate(106) are formed on the conductive film for the second floating gate.</p>
申请公布号 KR20100074656(A) 申请公布日期 2010.07.02
申请号 KR20080133145 申请日期 2008.12.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, SANG SOO;SHIN, SEUNG WOO;KIM, JAE MUN
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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