发明名称 |
METHOD OF MANUFACTURING EPITAXIAL WAFER AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing an epitaxial wafer having a superjunction structure which suppresses formation of a cavity and saves trouble and cost, and to provide a method of manufacturing a semiconductor device. SOLUTION: The method of manufacturing the epitaxial wafer in which the epitaxial wafer 10 which has the superjunction structure 12 is formed includes the following processes. A substrate 11 is prepared. A first layer of a first conductivity type is formed on the substrate 11. A mesa structure is formed in the first layer. A second layer of a second conductivity type is formed in a recessed part of the mesa structure of the first layer by a liquid-phase growing method. The method of manufacturing the semiconductor device includes the following processes. The epitaxial wafer 10 is manufactured. A semiconductor layer is formed on the epitaxial wafer 10. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010147182(A) |
申请公布日期 |
2010.07.01 |
申请号 |
JP20080321395 |
申请日期 |
2008.12.17 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
MASUDA KENRYO;WADA KEIJI;HARADA MAKOTO |
分类号 |
H01L21/336;C30B19/12;C30B29/36;H01L21/208;H01L21/329;H01L29/12;H01L29/47;H01L29/739;H01L29/78;H01L29/872 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|