发明名称 X-RAY INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To obtain an X-ray inspection apparatus determining the quality of an inspection target and usable in the selection of a class. SOLUTION: A mass estimating part 83 estimates the mass of the inspection target 8 on the basis of the quantity of transmitted X rays detected by an X-ray detecting part 6. A mass class determining part 84 determines a mass class to which the inspection target 8 belongs on the basis of the data S1 input from the mass estimating part 83 or determines the inspection target 8 to be abnormal when the mass of the inspection target 8 does not belong to the mass class within a predetermined range and an image forming part 85 forms an X-ray transmitted image on the basis of the quantity of transmitted X rays detected by the X-ray detecting part 6. A shape determining part 86 determines the normality/abnormality of the shape of the inspection target 8 and a badness determining part 87 determines the inspection target 8 to be a bad article when the respective determine results of the mass class determining part 84 and the shape determining part 86 are abnormal, or the like. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010145135(A) 申请公布日期 2010.07.01
申请号 JP20080320096 申请日期 2008.12.16
申请人 ISHIDA CO LTD 发明人 TSUNO MASAO;MIYAZAKI SEIJI;YAMAMOTO SHINYA;YAMAMOTO YASUSHI;YAMAMOTO YASUHIRO;MATSUMURA TETSUJI;KATAYAMA KOJI
分类号 G01N23/04 主分类号 G01N23/04
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