| 摘要 |
A test system for semiconductor devices based on network monitoring is disclosed. The test system includes a testing apparatus, a test system server and one or more control terminals. The test system server wirelessly receives the test request transmitted from the testing apparatus, the control terminals, the designing apparatus or the manufacturing apparatus. According to the test request, the test system sever wirelessly transmits the test information to the testing apparatus to proceed with a test process for a semiconductor device. |
