发明名称 PHOTORESIST COMPOSITION FOR IMMERSION LITHOGRAPHY CONTAINING FLUORINE ADDITIVES
摘要 <p>PURPOSE: A photoresist composite for an immersion lithography is provided to prevent the leakage of the photoresist composite by a water soluble medium during the immersion lithography by applying the strong hydrophobicity to a photoresist film layer. CONSTITUTION: A photoresist composite for an immersion lithography contains a fluorine group compound, a photosensitive polymer, a photo acid generator, and an organic solvent. The fluorine group compound is marked with chemical formula 1 or chemical formula 2. In the chemical formulas, a refers to O, S, or N. The photosensitive polymer includes a monomer marked with chemical formula 3. In the chemical formula 3, R refers to hydrogen, or a fluorine substituted or non-substituted alkyl or cycloalkyl group with the carbon number of 1~30.</p>
申请公布号 KR20100073312(A) 申请公布日期 2010.07.01
申请号 KR20080131944 申请日期 2008.12.23
申请人 DONGBU HITEK CO., LTD. 发明人 PARK, CHAN SIK
分类号 G03F7/004 主分类号 G03F7/004
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