FOCUSED ION BEAM DEEP NANO-PATTERNING APPARATUS AND METHOD,申请号IL20090201877-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	FOCUSED ION BEAM DEEP NANO-PATTERNING APPARATUS AND METHOD
摘要
申请公布号	IL201877(D0)	申请公布日期	2010.06.30
申请号	IL20090201877	申请日期	2009.11.01
申请人	TECHNION RESEARCH AND DEVELOPMENT FOUNDATION LTD.	发明人
分类号	B82B	主分类号	B82B
代理机构		代理人
主权项
地址

您可能感兴趣的专利

METHOD AND DEVICE FOR TRANSCRIPTION BY DOUBLE COLOR COPIER

ELECTROPHOTOGRAPHIC RECEPTOR

PHOTOGRAPHING DEVICE

OPEN/CLOSE WEIGHT REDUCING DEVICE OF OPEN/CLOSE MATTER

MANUFACTURE OF SEMICONDUCTOR DEVICE

JOINT BOX WITH CONNECTOR

SMOOTHENING TREATMENT AGENT FOR THERMOPLASTIC SYNTHETIC FIBER

ELECTROCHEMICAL STORAGE BATTERY

OVER-HEATING PREVENTING DEVICE FOR SOLAR HEAT COLLECTOR UNIT

SEMICONDUCTOR DEVICE

PHOTOGRAPHIC MATERIAL, MANUFACTURE THEREOF, GENERATION OF PHOTOGRAPHIC IMAGE AND NEW TRIAZOLE

WATER COOLER/HEATER

PHOTOELECTRIC SWITCH

METHOD OF PRODUCING POLYETHYLENE CABLE

VENT HEATER AND HEAT SENSOR UNIT

DUST COLLECTING METHOD FOR COAL BURNING PLANT